Euro DesignCon 2004

نویسنده

  • Hubert Werkmann
چکیده

This paper will start with an introduction into PCI Express architecture. It will highlight what the pre-requisites for testing PCI Express are and what test strategies have to be followed for testing this type of device efficiently. Besides the raw speed support and the adaptation to embedded clock interface specifics, emphasis will be put on the protocol induced difficulties for high volume testing. Proposals regarding design for testability (DfT) features that go beyond the ones that are mandatory for PCI Express will be made to reduce test and configuration time of the device under test. Besides these DfT features, the key electrical parameters and ways to test them efficiently on an ATE system will be described based on measurements on real PCI Express silicon.

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تاریخ انتشار 2005